DataRay offers three approaches: UV sensitive slit-scanners, UV sensitive cameras and add-on UV converters for cameras.
- X-ray to 400 nm - for beam imaging, the generally preferred approach is the camera add-on UV to visible converter range, available from X-ray to 400 nm, handling beam diameters from 100 µm up to around 30 mm. These screw-on assemblies offer high damage thresholds, excellent linearity, and lengthy lifetimes.
- > 190 nm - for small CW beams below 4 mm, slit scan XY profiling systems with response down to 190 nm are very suitable, but frequently UV measurements require a true image.
- > 266 nm - an alternative, handling lower direct irradiance levels is WinCamD-UV and BladeCam-UV models (available with the WinCamD-UCD12, WinCamD-UCD23, WinCamD-XHR, and BladeCam-XHR) for operation down to 266 nm; these are CCD/CMOS sensors with their polymer lenslets removed. These will be stable at 355 nm, but at 266 nm the silicon will eventually degrade leading to higher dark current and lower sensitivity. Absolute data on such deterioration effects is limited.
If you are unsure as to which is most suitable, Ask an Expert, or contact us directly.
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