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Why We Tilt Our Filters

Posted by Lucas Hofer on 7/21/2016 to App Notes

In this blog post, we explain why tilting our filters is necessary for an accurate beam measurement.

Flat-Top Beams and Plateau Uniformity Calculations

Posted by Lucas Hofer on 2/26/2016 to App Notes

A flat-top beam (otherwise known as a top-hat) is used in various applications where a controlled profile is desired (i.e. a uniform density across the irradiated surface). Passing a Gaussian beam through special optics will create the flat-top beam and is the most common way of generating a flat-top beam. Uniform excimer beams are used in many material processing applications (e.g. creating integrated circuits). Industries such as welding, drilling, and medicine also make extensive use of flat-top beams. Although a rough estimate of a flat-top beam’s uniformity can be gauged visually using the image of the beam profile taken with a CCD or CMOS camera, a more accurate method is needed. The DataRay software (versions LCMvD23 and later) reports the plateau uniformity value, which gives the full width half maximum (FWHM) width of the beam’s power density histogram. The plateau uniformity of the flat-top beam is a value between zero and one used to quantify the uniformity of the flat-top beam. Zero represents a perfect flat-top beam. As the flat-top beam deviates from the theoretical flat-top, the value moves towards one. DataRay adheres to the ISO 13694 procedure for calculating the plateau uniformity. The plateau uniformity has the advantage of providing a single metric to characterize the beam uniformity across the entirety of the beam profile, rather than looking at individual slices of the beam.

Image Degradation Diagnosis and Filter/Sensor Cleaning

Posted by Lucas Hofer on 1/21/2016 to App Notes

Although DataRay does not recommend cleaning beam profiling camera sensors due to the delicacy of the parts, cleaning may become necessary if dirt is interfering with the quality of laser beam profiling measurements. If the user decides to clean the sensor, we recommend extreme caution as user-damaged sensors are not covered by the camera’s three-year warranty.

Tutorial: WinCamD and BeamMap2 Interface to Labview

Posted by Lucas Hofer on 1/6/2016 to App Notes

Beam Profiling for Small Beam Widths or Spot Size

Posted by Melinda Dragone on 9/14/2015 to App Notes
Beam Profiling for Small Beam Widths or Spot Size

Beam width or spot size is an important parameter to identify in selecting the optimal beam profiler. Scanning slit beam profilers are ideal for measuring small Gaussian beams. DataRay Inc.’s Beam’R2 and BeamMap2 are capable of measuring beams as small as 2 µm using knife-edge slits. Camera-based beam profilers, such as the WinCamD and BladeCam series, are ideal if a true two-dimensional image is desired. This is essential when viewing non-Gaussian beams...

Profiling Large Laser Beams: Considerations and Solutions

Posted by DataRay on 8/18/2015 to App Notes
Profiling Large Laser Beams: Considerations and Solutions

Profiling large laser beams is a common industry need, one with many challenges. What is small to one researcher may be quite large to another. For example, the diameter of a "large" beam may be a relatively small 5 mm, or up to tens of millimeters or larger. Fortunately, DataRay offers several solutions for measuring large beam profiles...