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BeamMap2 – XYZΘΦ Scanning Slit Beam Profiler System

BeamMap2 – XYZΘΦ Scanning Slit Beam Profiler System

Product ID:BMS2
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Model
Detector type
Plane spacing help

Multiple Z-plane XYZΘΦ Scanning Slit, 190 – 2500* nm

Port-powered USB 2.0

Features

  • 190 to 1150 nm, Silicon detector
  • 650 to 1800 nm, InGaAs detector
  • 1000 to 2300 or 2500 nm, InGaAs (extended) detector
  • Multiple plane spacing options available – please review this worksheet to identify the correct plane spacing for your application
  • Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode*
  • Port-powered USB 2.0; flexible 3 m cable, no power brick
  • 0.1 µm sampling and resolution
  • Linear & log X-Y profiles, centroid
  • Profile zoom & slit width compensation
  • Real-time multiple Z plane scanning slit system
  • Real-time XYZ profiles, Focus position
  • Real-time M², Divergence, Collimation, Alignment

Applications

  • Laser printing & marking
  • Medical lasers
  • Diode laser systems
  • Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
  • Development, production, field service
  • CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]

* model-dependent

BeamMap2 puck schematic