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BeamScope-P8 – Scanning Slit Beam Profiler System

BeamScope-P8 – Scanning Slit Beam Profiler System

Product ID:BSC-P8
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Choose Options

Detector type
Probe depth
Slit/aperture type
Slit/aperture size

Probing Head XY Scanning Slit, 190 – 3500* nm

USB 2.0

Features

  • 190 to 1150 nm, Silicon detector
  • Beam dimensions ~100 µm to 45 mm
  • ISO 11146 compliant
  • Narrow probe for confined spaces
  • Front-mounted slits/apertures
  • Wide dynamic range
  • M² option – beam propagation analysis, divergence, focus
  • 2D scan option – 45 x 23 mm scanned area image

Applications

  • Laser & laser diode characterization
  • Laser assembly development, alignment, characterization, production test & QA
  • MIR Laser Profiling*
  • M² measurement with available M2DU stage
  • Lasers & laser assemblies for:
    • Disk & wafer characterization
    • Laser printing & marking
    • Medical lasers
    • Bar code scanners

* model-dependent

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