Scanning Slit Beam Profilers

DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.

If you are unsure as to which of our scanning slit beam profilers is most suitable for your application, please feel free to contact us.

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