DataRay can provide camera and scanning slit instruments with suitable sampling and attenuation accessories that measure industrial lasers away from the cutting plane. Supported wavelengths are 190 nm to 16 μm, system dependent. Please contact us with your specific requirements.
If you are unsure as to which is most suitable for your application, please contact us or use our Product Selector.
|Application||WinCamD series||BladeCam series||TaperCamD series||Beam'R series||BeamMap series||BeamScope series|
|Industrial Laser Analysis*|
model-dependent or requires accessories
* may require sampling/attenuation