DataRay's beam profiling systems are designed to suit a number of varied applications, including:
- XY Beam Profiling and 2D Imaging
- Real-time XYZΘΦ Profiling
- Divergence Measurement
- Pointing Measurement
- Focus Measurement
- M² Measurement & Analysis
- Industrial Laser Analysis
- UV and X-ray Beam Profiling
- Visible Laser Beam Profiling
- NIR and Telecom Beam Profiling
- MWIR and FIR Beam Profiling
- Line and Laser Profiling & Analysis
- Large Beam Profiling & Analysis
Don't see your application?
Contact us and a sales engineer will be pleased to assist you in identifying the ideal solution for your specific needs.