BeamMap2-CM Collimate – XYZΘΦ Scanning Slit

USB 2.0
Product ID: S-BMS2-CM4-Si-5

Usually ships in 5-10 days

Multiple Z-plane XYZΘΦ Scanning Slit System, 190 to 2500* nm

Port-powered USB 2.0

Features

  • 190 to 1150 nm, Silicon detector
  • 650 to 1800 nm, InGaAs detector
  • 1000 to 2300 or 2500 nm, InGaAs (extended) detector
  • Beam diameters ~100 µm to ~3 mm (1.5 mm with extended InGaAs)
  • 25 µm slit pairs with Si; 0.1 to 2 µm sampling intervals
  • 50 µm slit pairs with InGaAs; 0.1 to 2 µm sampling intervals
  • Real-time ±1 mr real-time Divergence and Pointing measurement accuracy
  • Port-powered USB 2.0; flexible 3 m cable; no power brick
  • 0.1 µm sampling and resolution
  • Linear & log X-Y profiles, centroid
  • Profile zoom & slit width compensation
  • Real-time multiple Z plane scanning slit system
  • Real-time XYZ profiles, Focus position
  • Real-time M², Divergence, Collimation, Alignment

Applications

  • Laser printing & marking
  • Medical lasers
  • Diode laser systems
  • Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
  • Development, production, field service
  • CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
  • M² measurement with available M2DU stage

* model-dependent

BeamMap graphic

SpecificationDetail
WavelengthSi detector: 190 to 1150 nm
InGaAs detector: 650 to 1800 nm
Si + InGaAs detectors: 190 to 1800 nm
Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm
Scanned Beam DiametersSi detector: 5 µm to 4 mm, to 2 µm in Knife-Edge mode*
InGaAs detector: 10 µm to 3 mm, to 2 µm in Knife-Edge mode*
InGaAs (extended) detector: 10 µm to 2 mm, to 2 µm in Knife-Edge mode*
Plane Spacing (CM4 models)5 mm: -5, 0, +5, +20 mm
Plane Spacing (CM3 models)10 mm: -10, 0, +10, 0 mm
Beam Waist Diameter MeasurementSecond moment (4s) diameter to ISO 11146; Fitted Gaussian & TopHat
1/e² (13.5%) width
User selectable % of peak
Knife-Edge mode* for very small beams
Beam Waist Position Measurement± 20 µm best in X, Y, and Z — contact DataRay for recommendation
Measured SourcesCW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
Resolution Accuracy0.1 µm or 0.05% of scan range
± < 2% ± = 0.5 µm
M² Measurement1 to > 20, ± 5%
Divergence/Collimation, Pointing1 mrad best — contact DataRay for recommendation
Maximum Power & Irradiance1 W Total & 0.5 mW/µm²
Gain Range1,000:1 Switched 4,096:1 ADC range
Displayed GraphicsX-Y-Z Position & Profiles, Zoom x1 to x16
Update Rate~5 Hz
Pass/Fail DisplayOn-screen selectable Pass/Fail colors. Ideal for QA & Production.
AveragingUser selectable running average (1 to 8 samples)
StatisticsMin., Max., Mean, Standard Deviation
Log data over extended periods
XY Profile & CentroidBeam Wander display and logging
Minimum PC RequirementsWindows, 2 GB RAM, USB 2.0/3.0 port


* Knife-Edge mode requires CM3 model

Product specifications are subject to change without notice

 

eDrawings EASM

STEP 3D Model

Adobe PDF