- X-ray to 400 nm – for beam imaging, the generally preferred approach is a UV converter attached to a Beam Profiling Camera, handling beam diameters from 100 μm up to around 30 mm. These screw-on assemblies offer high damage thresholds, excellent linearity, and lengthy lifetimes.
- ≥ 190 nm (no image required) – for small CW beams below 4 mm, Scanning Slit Beam Profilers with response down to 190 nm are well suited.
- ≥ 190 nm (image required) – Specific Beam Profiling Camera systems are available in UV capable configurations suitable for operation down to 163 nm. These UV capable cameras are stable at 355 nm, but at 266 nm and lower, the silicon detector will eventually degrade leading to higher dark current and lower sensitivity. Replacement detectors are available.
If you are unsure as to which is most suitable for your application, please contact us or use our Product Selector.
|Application||WinCamD series||BladeCam series||TaperCamD series||Beam'R series||BeamMap series||BeamScope series|
|UV and X-Ray|
model-dependent or requires accessories